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Advances in X-Ray Analysis: Volume 35b

Advances in X-Ray Analysis: Volume 35b

Hardcover

Series: Advances in X-Ray Analysis, Book 35

Technology & EngineeringChemistry

ISBN10: 0306442493
ISBN13: 9780306442490
Publisher: Springer Nature
Published: Oct 1 1992
Pages: 648
Weight: 2.69
Height: 1.38 Width: 6.69 Depth: 9.61
Language: English
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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