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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

Paperback

Series: Advanced Materials Processing and Manufacturing

Technology & Engineering

ISBN10: 1032375116
ISBN13: 9781032375113
Publisher: CRC Press
Published: Nov 29 2024
Pages: 130
Weight: 0.47
Height: 0.31 Width: 6.14 Depth: 9.21
Language: English

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

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Kumar, Ch Sateesh

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Technology & Engineering