Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
612-822-4611

  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Advanced Mathematical and Computational Tools in Metrology and Testing VIII

Advanced Mathematical and Computational Tools in Metrology and Testing VIII

Pavese, Franco
Baer, Markus
Forbes, Alistair B.

Hardcover

Series: Advances in Mathematics for Applied Sciences, Book 78

General MathematicsPre-Calculus

ISBN10: 9812839518
ISBN13: 9789812839510
Publisher: World Scientific Publishing Company
Published: Apr 1 2009
Pages: 424
Weight: 1.60
Height: 1.10 Width: 6.10 Depth: 9.00
Language: English
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields.This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.

1 different editions

Also available

Also from

Pavese, Franco

View All

Also in

General Mathematics

View All