Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
612-822-4611

  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

Roberts, Gordon W.
Lu, Albert K.

Paperback

Series: The Springer International Engineering and Computer Science, Book 312

Technology & Engineering

ISBN10: 1461359929
ISBN13: 9781461359920
Publisher: Springer Nature
Published: Sep 27 2012
Pages: 122
Weight: 0.42
Height: 0.29 Width: 6.00 Depth: 9.00
Language: English
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

1 different editions

Also available

Also in

Technology & Engineering

View All