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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
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612-822-4611
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Hardcover

Series: Nanoscience and Technology

Medical ReferenceTechnology & EngineeringChemistry

ISBN10: 3540284052
ISBN13: 9783540284055
Publisher: Springer
Published: Aug 4 2006
Pages: 292
Weight: 1.34
Height: 0.75 Width: 6.14 Depth: 9.21
Language: English

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Technology & Engineering