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Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms

Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms

Hardcover

Series: Springer Advanced Microelectronics, Book 48

Technology & EngineeringGeneral MathematicsPhysics

ISBN10: 9400777809
ISBN13: 9789400777804
Publisher: Springer Nature
Published: Nov 28 2013
Pages: 192
Weight: 1.05
Height: 0.50 Width: 6.14 Depth: 9.21
Language: English

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.

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