Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strategies for Low Power Devices

Nicolici, Nicola
Wen, Xiaoqing
Girard, Patrick

Paperback

Technology & EngineeringGeneral Computers

ISBN10: 1489983139
ISBN13: 9781489983138
Publisher: Springer
Published: Sep 5 2014
Pages: 363
Weight: 1.19
Height: 0.80 Width: 6.14 Depth: 9.21
Language: English

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

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