Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry

Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry

Williams, David B.
Carter, C. Barry

Hardcover

Technology & EngineeringGeneral Science

Currently unavailable to order

ISBN10: 3319266497
ISBN13: 9783319266497
Publisher: Springer
Published: Sep 5 2016
Pages: 518
Weight: 4.34
Height: 1.35 Width: 8.50 Depth: 11.54
Language: English
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging--the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

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