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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

Huhn, Sebastian
Drechsler, Rolf

Paperback

Technology & EngineeringGeneral Computers

ISBN10: 3030692116
ISBN13: 9783030692117
Publisher: Springer
Published: Apr 20 2022
Pages: 164
Weight: 0.60
Height: 0.40 Width: 6.14 Depth: 9.21
Language: English

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

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