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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Hardcover

Chemistry

ISBN10: 1118480481
ISBN13: 9781118480489
Publisher: Wiley
Published: Sep 5 2014
Pages: 384
Weight: 1.45
Height: 0.90 Width: 6.20 Depth: 9.30
Language: English
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
- Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
- Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
- Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
- Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
- Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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Chemistry