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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232

Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232

Hardcover

Series: Advances in Imaging and Electron Physics, Book 232

Technology & Engineering

ISBN10: 044329786X
ISBN13: 9780443297861
Publisher: Academic Press
Published: Nov 27 2024
Pages: 232
Weight: 1.06
Height: 0.56 Width: 6.00 Depth: 9.00
Language: English
Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Also from

Hawkes, Peter W.

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Technology & Engineering