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Advances in Optics of Charged Particle Analyzers: Part 2: Volume 233

Advances in Optics of Charged Particle Analyzers: Part 2: Volume 233

Hardcover

Series: Advances in Imaging and Electron Physics, Book 233

Technology & Engineering

Currently unavailable to order

ISBN10: 0443317208
ISBN13: 9780443317200
Publisher: Academic Press
Published: May 21 2025
Pages: 298
Weight: 1.34
Height: 0.61 Width: 6.37 Depth: 9.28
Language: English
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

Also from

Hawkes, Peter W.

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Technology & Engineering