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Quantitative Atomic-Resolution Electron Microscopy: Volume 217

Quantitative Atomic-Resolution Electron Microscopy: Volume 217

Hardcover

Series: Advances in Imaging and Electron Physics, Book 217

Technology & Engineering

ISBN10: 0128246073
ISBN13: 9780128246078
Publisher: Academic Press
Published: Apr 7 2021
Pages: 294
Weight: 1.24
Height: 0.69 Width: 6.00 Depth: 9.00
Language: English
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting, Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.

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Technology & Engineering